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Multiphysics simulation study of thermal stress effects in nanoscale FinFETs heterogeneously integrated with GaN high-power device on silicon substrate.
Huali Duan
Erping Li
Qinyi Huang
Yuehang Xu
Wenchao Chen
Published in:
Microelectron. J. (2024)
Keyphrases
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simulation study
high power
high density
field effect transistors
semiconductor devices
low power
monte carlo
low cost
high speed
thin film
steady state
data center
power supply
neural network
multiscale