Douglas M. Bishop

Publication Activity (10 Years)

Years Active: 2019-2023
Publications (10 Years): 3

Top Topics

Reliability Assessment

Top Venues

Publications

Wei-Chih Chien, E. K. Lai, L. Buzi, C. W. Cheng, C. W. Yeh, A. Ray, L. M. Gignac, N. Gong, H. Y. Cheng, A. Grun, D. Y. Lee, W. Kim, A. Majumdar, Douglas M. Bishop, Robert L. Bruce, D. Daudelin, H. Y. Ho, M. J. BrightSky, H. L. Lung
A Comprehensive Study on the Pillar Size of OTS-PCM Memory with an Optimized Process and Scaling Trends Down to Sub-10 nm for SCM Applications. IMW (2023)
Paul M. Solomon, Douglas M. Bishop, Teodor K. Todorov, Simon Dawes, Damon B. Farmer, Matthew Copel, Ko-Tao Lee, John Collins, John Rozen
Transient Investigation of Metal-oxide based, CMOS-compatible ECRAM. IRPS (2021)
Eduard A. Cartier, Wanki Kim, Nanbo Gong, Tayfun Gokmen, Martin M. Frank, Douglas M. Bishop, Youngseok Kim, Seyoung Kim, Takashi Ando, Ernest Y. Wu, Praneet Adusumilli, John Rozen, Paul M. Solomon, Wilfried Haensch, Matthew J. BrightSky, Abu Sebastian, Geoffrey W. Burr, Vijay Narayanan
Reliability Challenges with Materials for Analog Computing. IRPS (2019)