Dongil Kim

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 20

Top Topics

Training Dataset

Partially Labeled

Semiconductor Manufacturing

Top Venues

Expert Syst. Appl.

Pattern Anal. Appl.

Publications

Hyungtaik Oh, Wonkeun Jo, Dongil Kim
Attention-based sequential recommendation system using multimodal data. CoRR (2024)
Wonkeun Jo, Dongil Kim
NFCL: Simply interpretable neural networks for a short-term multivariate forecasting. CoRR (2024)
Wonkeun Jo, Dongil Kim
Neural additive time-series models: Explainable deep learning for multivariate time-series prediction. Expert Syst. Appl. 228 (2023)
Soomin Lee, Wonkeun Jo, Hyein Kim, Jeongin Koo, Dongil Kim
Deep learning-based cutting force prediction for machining process using monitoring data. Pattern Anal. Appl. 26 (3) (2023)
Heechang Chung, Dongil Kim, Sokpal Cho
A Study on the Cultivation Plan Service at the Preliminary production phase based on bigdata analysis. ICACT (2022)
Wonkeun Jo, Dongil Kim
Neural Additive Models for Nowcasting. CoRR (2022)
Heechang Chung, Dongil Kim, Sokpal Cho
A Study on the Service model of risk mitigation on livestock pandemic based on Networks. ICACT (2022)
Jinyoung Choi, Soomin Lee, Seonyoung Kim, Dongil Kim, Hyungshin Kim
Depressed Mood Prediction of Elderly People with a Wearable Band. Sensors 22 (11) (2022)
Wonkeun Jo, Dongil Kim
OBGAN: Minority oversampling near borderline with generative adversarial networks. Expert Syst. Appl. 197 (2022)
Heechang Chung, Dongil Kim, Sokpal Cho
A Study on the Cultivation Plan Service at the Preliminary production phase based on bigdata analysis. ICACT (2021)
Dongil Kim, Seokho Kang, Sungzoon Cho
Expected margin-based pattern selection for support vector machines. Expert Syst. Appl. 139 (2020)
Heechang Chung, Dongil Kim, Kyoung-Sook Jung, Byeong-Beom Kang, Sokpal Cho, Soonghee Lee
Study on Service model of the Agriculture Information based Convergence Service. ICACT (2020)
Heechang Chung, Dongil Kim, Soonghee Lee, Sokpal Cho
Smart Farming Education Service based on u-learning environment. ICACT (2019)
Dongil Kim, Jeongin Koo, Hyein Kim, Seokho Kang, Sang-Hyun Lee, Jeong-Tae Kang
Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis. Int. J. Distributed Sens. Networks 15 (2) (2019)
Seokho Kang, Dongil Kim, Sungzoon Cho
Approximate training of one-class support vector machines using expected margin. Comput. Ind. Eng. 130 (2019)
Doyup Lee, Suehun Jung, Yeongjae Cheon, Dongil Kim, Seungil You
Demand Forecasting from Spatiotemporal Data with Graph Networks and Temporal-Guided Embedding. CoRR (2019)
Eun Jeong Choi, Eunjung Lim, Minjung Kwak, Miri Jeong, Nayoung Lee, Il Bum Kwon, Wonpyo Lee, Hanwool Ku, Dongil Kim, Haesung Nam, Junsik Na, Myonghwa Park
Development of ICT-Based Comprehensive Health and Social-Needs Assessment System to Enhance Person-Centered Community Care. MedInfo (2019)
Nayoung Lee, Minjung Kwak, Miri Jeong, Eun Jeong Choi, Eunjung Lim, Il Bum Kwon, Wonpyo Lee, Hanwool Ku, Dongil Kim, Haesung Nam, Junsik Na, Myonghwa Park
Pilot Testing of an ICT-Based Care Management Support System to Deliver Integrated Community Care. MedInfo (2019)
Dongil Kim, JeeEun Karin Nam, JungSu Oh, Min Chul Kang
A latent profile analysis of the interplay between PC and smartphone in problematic internet use. Comput. Hum. Behav. 56 (2016)
Pilsung Kang, Dongil Kim, Sungzoon Cho
Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing. Expert Syst. Appl. 51 (2016)
Dongil Kim, Pilsung Kang, Seung-kyung Lee, Seokho Kang, Seungyong Doh, Sungzoon Cho
Improvement of virtual metrology performance by removing metrology noises in a training dataset. Pattern Anal. Appl. 18 (1) (2015)
Pilsung Kang, Dongil Kim, Sungzoon Cho
Evaluating the reliability level of virtual metrology results for flexible process control: a novelty detection-based approach. Pattern Anal. Appl. 17 (4) (2014)
Dongil Kim, Sungzoon Cho
Pattern selection for support vector regression based response modeling. Expert Syst. Appl. 39 (10) (2012)
Dongil Kim, Pilsung Kang, Sungzoon Cho, Hyoungjoo Lee, Seungyong Doh
Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing. Expert Syst. Appl. 39 (4) (2012)
Pilsung Kang, Dongil Kim, Hyoungjoo Lee, Seungyong Doh, Sungzoon Cho
Virtual metrology for run-to-run control in semiconductor manufacturing. Expert Syst. Appl. 38 (3) (2011)
Dongil Kim, Eunsam Kim, Choonhwa Lee
Efficient peer-to-peer overlay networks for mobile IPTV services. IEEE Trans. Consumer Electron. 56 (4) (2010)
Pilsung Kang, Hyoungjoo Lee, Sungzoon Cho, Dongil Kim, Jinwoo Park, Chan-Kyoo Park, Seungyong Doh
A virtual metrology system for semiconductor manufacturing. Expert Syst. Appl. 36 (10) (2009)
Dongil Kim, Sungzoon Cho
Bootstrap Based Pattern Selection for Support Vector Regression. PAKDD (2008)
Dongil Kim, Hyoungjoo Lee, Sungzoon Cho
Response modeling with support vector regression. Expert Syst. Appl. 34 (2) (2008)
Youngjoo Lee, Joon Beom Seo, Bokyoung Kang, Dongil Kim, June-Goo Lee, Song Soo Kim, Namkug Kim, Suk-Ho Kang
Performance comparison of classifiers for differentiation among obstructive lung diseases based on features of texture analysis at HRCT. Medical Imaging: Image Processing (2007)
Dongil Kim, Sungzoon Cho
epsilon-Tube Based Pattern Selection for Support Vector Machines. PAKDD (2006)
Meixun Jin, Mi-Young Kim, Dongil Kim, Jong-Hyeok Lee
Segmentation of Chinese Long Sentences Using Commas. SIGHAN@ACL (2004)