Improvement of virtual metrology performance by removing metrology noises in a training dataset.
Dongil KimPilsung KangSeung-kyung LeeSeokho KangSeungyong DohSungzoon ChoPublished in: Pattern Anal. Appl. (2015)
Keyphrases
- training dataset
- camera calibration
- single view
- process control
- training data
- data samples
- virtual environment
- training samples
- training set
- multi view
- low signal to noise ratio
- neural network
- small number
- class labels
- virtual reality
- multiple views
- classification accuracy
- active learning
- object recognition
- support vectors
- video sequences
- e learning
- computer vision