Login / Signup
Daniel S. Reed
Publication Activity (10 Years)
Years Active: 2016-2018
Publications (10 Years): 2
Top Topics
Text Entry
Physical Design
Error Rate
Top Venues
IRPS
IEEE Trans. Circuits Syst. I Regul. Pap.
</>
Publications
</>
Balaji Narasimham
,
Saket Gupta
,
Daniel S. Reed
,
J. K. Wang
,
Nick Hendrickson
,
Hasan Taufique
Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs.
IRPS
(2018)
Saket Gupta
,
Carl Monzel
,
Daniel S. Reed
,
Yifei Zhang
,
Mark Winter
,
Myron Buer
Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories.
IEEE Trans. Circuits Syst. I Regul. Pap.
(7) (2016)