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Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs.

Balaji NarasimhamSaket GuptaDaniel S. ReedJ. K. WangNick HendricksonHasan Taufique
Published in: IRPS (2018)
Keyphrases
  • error rate
  • test set
  • lower error rates
  • rule sets
  • misclassification rate
  • mobile devices
  • word error rate
  • training set
  • language model
  • character recognition
  • text entry
  • equal error rate