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Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories.
Saket Gupta
Carl Monzel
Daniel S. Reed
Yifei Zhang
Mark Winter
Myron Buer
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2016)
Keyphrases
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design process
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design processes
single chip
circuit design
vlsi implementation
cmos technology
physical design
manufacturing process
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printed circuit boards
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neural network