Chaohui He

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 7

Top Topics

Component Failures

Simulation Study

Fault Injection

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Sci. China Inf. Sci.

Publications

Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error. J. Electron. Test. 34 (6) (2018)
Jinxin Zhang, Qi Guo, Hongxia Guo, Wu Lu, Chaohui He, Xin Wang, Pei Li, Lin Wen
Co γ irradiation under different biases. Microelectron. Reliab. 84 (2018)
Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. J. Electron. Test. 34 (1) (2018)
Wen Zhao, Chaohui He, Wei Chen, Rongmei Chen, Peitian Cong, Fengqi Zhang, Zujun Wang, Chen Shen, Lisang Zheng, Xiaoqiang Guo, Lili Ding
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. Microelectron. Reliab. 87 (2018)
Jinxin Zhang, Hongxia Guo, Fengqi Zhang, Chaohui He, Pei Li, Yunyi Yan, Hui Wang, Linxia Zhang
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor. Sci. China Inf. Sci. 60 (12) (2017)
Xuecheng Du, Shuhuan Liu, Dongyang Luo, Yao Zhang, Xiaozhi Du, Chaohui He, Xiaotang Ren, Weitao Yang, Yuan Yuan
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip. Microelectron. Reliab. 71 (2017)
Du Tang, Ignacio Martin-Bragado, Chaohui He, Hang Zang, Cen Xiong, Yonghong Li, Daxi Guo, Peng Zhang, Jinxin Zhang
Time dependent modeling of single particle displacement damage in silicon devices. Microelectron. Reliab. 60 (2016)
Cen Xiong, Yonghong Li, Shuhuan Liu, Du Tang, Jinxin Zhang, Chaohui He
Hot carrier effect on a single SiGe HBT's EMI response. Microelectron. Reliab. 55 (12) (2015)
Cen Xiong, Shuhuan Liu, Yonghong Li, Du Tang, Jinxin Zhang, Xuecheng Du, Chaohui He
Hot carrier effect on the bipolar transistors' response to electromagnetic interference. Microelectron. Reliab. 55 (3-4) (2015)
Jinxin Zhang, Chaohui He, Hongxia Guo, Du Tang, Cen Xiong, Pei Li, Xin Wang
3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment. Microelectron. Reliab. 55 (8) (2015)