Shuhuan Liu

Publication Activity (10 Years)

Years Active: 2015-2023
Publications (10 Years): 6

Top Topics

Radiation Doses

Component Failures

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Publications

Shuhuan Liu, Xiaoshan Yu, Haiping Ma, Ziwen Wang, Chuan Qin, Xingyi Zhang
Homogeneous Cohort-Aware Group Cognitive Diagnosis: A Multi-grained Modeling Perspective. CIKM (2023)
Zhuoqi Li, Shuhuan Liu, Ci Song, Ning Han, Mathew Adefusika Adekoya
Experimental Investigation of the Effects of Reactor Neutron-Gamma Pulse Irradiation on SiGe HBTs Under Different Bias Conditions. IEEE Access 9 (2021)
Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error. J. Electron. Test. 34 (6) (2018)
Olarewaju Mubashiru Lawal, Shuhuan Liu, Zhuoqi Li, Aqil Hussain
Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs. Microelectron. Reliab. 82 (2018)
Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. J. Electron. Test. 34 (1) (2018)
Xuecheng Du, Shuhuan Liu, Dongyang Luo, Yao Zhang, Xiaozhi Du, Chaohui He, Xiaotang Ren, Weitao Yang, Yuan Yuan
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip. Microelectron. Reliab. 71 (2017)
Cen Xiong, Yonghong Li, Shuhuan Liu, Du Tang, Jinxin Zhang, Chaohui He
Hot carrier effect on a single SiGe HBT's EMI response. Microelectron. Reliab. 55 (12) (2015)
Cen Xiong, Shuhuan Liu, Yonghong Li, Du Tang, Jinxin Zhang, Xuecheng Du, Chaohui He
Hot carrier effect on the bipolar transistors' response to electromagnetic interference. Microelectron. Reliab. 55 (3-4) (2015)