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3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment.
Jinxin Zhang
Chaohui He
Hongxia Guo
Du Tang
Cen Xiong
Pei Li
Xin Wang
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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simulation study
monte carlo
positive and negative
real time
mobile robot
complex environments
thin film
single user
information retrieval
search algorithm
dynamic programming
field effect transistors
extreme events
dual channel