SCANNING DEVICES
Experts
- Dingyi Fang
- Xiaojiang Chen
- Jianyu Yang
- Yulin Huang
- Ju Wang
- Hongbo Jiang
- Shigehisa Tanaka
- Takanori Suzuki
- Yuebo Zha
- Royson Lee
- Koichiro Adachi
- Nicholas D. Lane
- Jie Xiong
- Stylianos I. Venieris
- Siyang Zuo
- Mark W. Schara
- Yuanming Shi
- Tomoya Yoshida
- Achim Schweikard
- Youichi Sakakibara
- Raymond Joseph Acciavatti
- Benjamin Billot
- Yong Zhou
- Ryotaro Konoike
- Ashwin De Silva
- Philipp H. Kindt
- Miaohui Wang
- Frédéric Giraud
- Kouji Nakahara
- Shuguang Cui
- Chiara Mocenni
- Simon Lind Kappel
- Katsunari Yoshioka
- Betty Lemaire-Semail
- Claus Vielhauer
- Mark W. Patton
- Mingde Zeng
- Zhanyong Tang
- Debatri Chatterjee
Venues
- Sensors
- CoRR
- IEEE Trans. Instrum. Meas.
- IEEE Access
- NEMS
- EMBC
- Remote. Sens.
- Comput. Electron. Agric.
- Proc. IEEE
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- IEEE SENSORS
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- MobiCom
- IEEE Robotics Autom. Lett.
- IRPS
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- IECON
- Device-Independent Color Imaging
- GHTC
- CHI
- IEEE Trans. Biomed. Eng.
- ICUMT
- CEIG
- IEEE Trans. Haptics
- J. Field Robotics
- I2MTC
- IEEE Consumer Electron. Mag.
- ICIT
- ASSETS
- ICPADS
- J. Sensors
- SVR
- ICC Workshops
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