RADIAL DISTORTION
Experts
- Tomás Pajdla
- Peter F. Sturm
- Zuzana Kukelova
- João Pedro Barreto
- Sota Shimizu
- Richard I. Hartley
- Kalle Åström
- Marc Pollefeys
- Helder Araújo
- Zhengyou Zhang
- Davide Scaramuzza
- Jen-Hui Chuang
- Luc Van Gool
- Martin Bujnak
- Xianghua Ying
- In-So Kweon
- Jun Sato
- Adrien Bartoli
- Srikanth Saripalli
- Kwan-Yee Kenneth Wong
- Zhanyi Hu
- Kenichi Kanatani
- Eric Hayman
- Anders Heyden
- Olivier D. Faugeras
- Hongbin Zha
- Aly A. Farag
- Roberto Cipolla
- Kevin L. Moore
- Yangquan Chen
- Lili Ma
- Yuchao Dai
- Shang-Hong Lai
- Reinhard Koch
- Hongdong Li
- Hanqi Zhuang
- Stephen J. Maybank
- Nobuyuki Hasebe
- Subodh Mishra
Venues
- CoRR
- Sensors
- CVPR
- ICCV
- ICRA
- IEEE Access
- IROS
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- ICPR
- IEEE Trans. Instrum. Meas.
- Int. J. Comput. Vis.
- Comput. Vis. Image Underst.
- Remote. Sens.
- Image Vis. Comput.
- Pattern Recognit. Lett.
- Mach. Vis. Appl.
- ICPR (1)
- MVA
- ICASSP
- IGARSS
- ITSC
- Pattern Recognit.
- ROBIO
- CVPR Workshops
- J. Comb. Theory, Ser. A
- IEEE Trans. Geosci. Remote. Sens.
- J. Electronic Imaging
- ISVC (2)
- ECCV (1)
- ACCV (1)
- WACV
- ECCV (2)
- IEEE Trans. Consumer Electron.
- VISAPP (1)
- IECON
- DAGM-Symposium
- IEEE Trans. Image Process.
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