PRACTICAL APPLICATION
Experts
- David N. Blank-Edelman
- Emiliano Schena
- Daniele Tosi
- Carlo Massaroni
- Orr Dunkelman
- Paola Saccomandi
- Thomas Schneider
- Pierre-Alain Fouque
- Nathan Keller
- Shigeo Hirose
- Ahmad-Reza Sadeghi
- Bin Wang
- Elaine Shi
- Dengguo Feng
- Madina Shaimerdenova
- Prasant Misra
- Yu Sasaki
- Daniela Lo Presti
- Bart Preneel
- Stefania Campopiano
- Aliya Bekmurzayeva
- Ling Ren
- Shivam Bhasin
- Haibin Zhang
- Sofiène Affes
- Adam Turoff
- Emil Stefanov
- Man Ho Au
- Jan Camenisch
- Gregor Seiler
- Muhammed F. Esgin
- Xueguang Qiao
- Christopher Kruegel
- Fang Wang
- Yuegang Tan
- Qiang Wang
- Dawn Song
- Gaëtan Leurent
- Iulian Iordachita
Venues
- CoRR
- Sensors
- IACR Cryptol. ePrint Arch.
- IEEE Access
- login Usenix Mag.
- IEEE Trans. Instrum. Meas.
- ICRA
- CCS
- IROS
- J. Robotics Mechatronics
- Remote. Sens.
- IEEE SENSORS
- IGARSS
- WSC
- AMIA
- IEEE Trans. Ind. Electron.
- ICC
- EMBC
- J. Sensors
- USENIX Security Symposium
- OFC
- ACC
- GLOBECOM
- I2MTC
- SAC
- IAS
- ITC
- Autom.
- Commun. ACM
- Softw. Pract. Exp.
- ICASSP
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Geosci. Remote. Sens.
- ACSAC
- Expert Syst. Appl.
- BMC Medical Informatics Decis. Mak.
- Technometrics
- IEEE Trans. Veh. Technol.
- Comput. Electron. Agric.
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