NI FE
Experts
- Andrés Iván Oliva
- Walter E. Proebster
- Simon Middelhoek
- Arthur V. Pohm
- Haixia Zhang
- Wolfgang Dietrich
- Zhaoxin Li
- J. E. Corona
- Jan Mackowiak
- Eduard Llobet
- Yi-Shao Lai
- Quan Yuan
- James F. Freedman
- Siegfried J. Methfessel
- Eric D. Diller
- Hua-Chiang Wen
- Kenjiro Tadakuma
- Xiao Zhang
- Jianbin Xu
- Min Jun Kim
- Jose Berengueres
- Armando Ramos Sebastian
- Joseph S. Friedman
- Viktor Sverdlov
- Yung Priscilla Lai
- Dong-Ming Fang
- Ping-Feng Yang
- Brian K. Taylor
- C. Wyatt
- E. Burkel
- K. Xue
- Bérangère Delourme
- Yudong Xia
- Frédéric Schwander
- Eric Navarrete
- Boyi Wang
- Tim Mike de Rijk
- B. Sundaravel
- Jaume Riba
Venues
- Sensors
- NEMS
- IBM J. Res. Dev.
- Microelectron. Reliab.
- Microelectron. J.
- IEEE Access
- CoRR
- IEEE SENSORS
- Symmetry
- IROS
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Biomed. Eng.
- NeuroImage
- Adv. Intell. Syst.
- ICRA
- Entropy
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Ind. Electron.
- CCE
- IEICE Trans. Electron.
- IEEE Trans. Electron. Comput.
- EMBC
- IEEE Robotics Autom. Lett.
- Quantum Inf. Process.
- IRE Trans. Electron. Comput.
- I2MTC
- IFIP Congress
- SENSORS
- J. Syst. Control. Eng.
- IEEE Trans. Robotics
- Open Syst. Inf. Dyn.
- URAI
- Comput. Geosci.
- ICMENS
- IAS
- AFIPS Fall Joint Computing Conference
- Commun. Nonlinear Sci. Numer. Simul.
- J. Comput. Phys.
- Appl. Math. Comput.
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