NI FE
Experts
- Simon Middelhoek
- Arthur V. Pohm
- Andrés Iván Oliva
- Walter E. Proebster
- Eduard Llobet
- Joseph S. Friedman
- Viktor Sverdlov
- J. E. Corona
- Zhaoxin Li
- Kenjiro Tadakuma
- Yung Priscilla Lai
- Haixia Zhang
- Dong-Ming Fang
- Yi-Shao Lai
- Min Jun Kim
- Siegfried J. Methfessel
- Hua-Chiang Wen
- Xiao Zhang
- Jan Mackowiak
- Jianbin Xu
- James F. Freedman
- Eric D. Diller
- Jose Berengueres
- Wolfgang Dietrich
- Armando Ramos Sebastian
- Quan Yuan
- Brian K. Taylor
- Ping-Feng Yang
- Massimo Vanzi
- Tao Zhu
- Wang-Tsung Wu
- Zhuo Chen
- Henan Fang
- Anders Lundström
- Doris Danninger
- P. Coquet
- Chang-Pin Chou
- Hiroaki Sukegawa
- Javier Sotelo Medina
Venues
- Sensors
- Microelectron. Reliab.
- IBM J. Res. Dev.
- NEMS
- Microelectron. J.
- IEEE Access
- CoRR
- Symmetry
- IEEE SENSORS
- IROS
- IEEE Trans. Instrum. Meas.
- Adv. Intell. Syst.
- ICRA
- Entropy
- IEEE Trans. Biomed. Eng.
- NeuroImage
- IEEE Trans. Electron. Comput.
- CCE
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Ind. Electron.
- IEICE Trans. Electron.
- IFIP Congress
- Quantum Inf. Process.
- I2MTC
- IRE Trans. Electron. Comput.
- EMBC
- IEEE Robotics Autom. Lett.
- ICMENS
- IAS
- IEICE Electron. Express
- Comput. Phys. Commun.
- Commun. Nonlinear Sci. Numer. Simul.
- Appl. Math. Comput.
- Open Syst. Inf. Dyn.
- URAI
- ICAIT
- Comput. Geosci.
- IEEE Trans. Robotics
- J. Vis.
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