MUTATION TESTING
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Gordon Fraser
- Mike Papadakis
- Vishwani D. Agrawal
- Andrea Arcuri
- Nina Yevtushenko
- Robert M. Hierons
- Mark Harman
- Yves Le Traon
- Hideo Fujiwara
- José Carlos Maldonado
- Inmaculada Medina-Bulo
- Kewal K. Saluja
- Tao Xie
- Bernhard K. Aichernig
- Jacob A. Abraham
- Khaled El-Fakih
- Prabhat Mishra
- Janak H. Patel
- Melvin A. Breuer
- Gregory Gay
- Raimund Ubar
- Yuzo Takamatsu
- Alexandre Petrenko
- Serge Demeyer
- Yoshinobu Higami
- Seiji Kajihara
- Gregg Rothermel
- Xiaoqing Wen
- Lingming Zhang
- Darko Marinov
- Kwang-Ting Cheng
- Márcio Eduardo Delamaro
- Kozo Kinoshita
- Pedro Delgado-Pérez
- Krishnendu Chakrabarty
- Sandeep K. Gupta
- Hiroshi Takahashi
Venues
- CoRR
- ITC
- ICST
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICST Workshops
- VTS
- Inf. Softw. Technol.
- Softw. Test. Verification Reliab.
- ICSE
- DAC
- ISSTA
- IEEE Trans. Software Eng.
- ASE
- ICCAD
- Asian Test Symposium
- IEEE Trans. Computers
- DATE
- J. Electron. Test.
- J. Syst. Softw.
- VLSI Design
- ISSRE
- IEEE Trans. Very Large Scale Integr. Syst.
- SSBSE
- ACM Trans. Design Autom. Electr. Syst.
- ESEC/SIGSOFT FSE
- ICTSS
- ACM Trans. Softw. Eng. Methodol.
- SAC
- FORTE
- HLDVT
- ETS
- ICCD
- ATS
- QSIC
- Empir. Softw. Eng.
- AST@ICSE
- Softw. Qual. J.
- GECCO
- QRS Companion
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