MANUFACTURING PROCESS
Experts
- MengChu Zhou
- Hesuan Hu
- George Q. Huang
- Paulo Leitão
- Romeo Ortega
- Birgit Vogel-Heuser
- José Guadalupe Romero
- Ye-Hwa Chen
- Andrea Matta
- Reza Tavakkoli-Moghaddam
- Jingshan Li
- Damien Trentesaux
- José Barata
- Jacquelien M. A. Scherpen
- Dawn M. Tilbury
- Andrew Y. C. Nee
- Alejandro Donaire
- Keyi Xing
- Jean-Pierre Kenné
- Yihai He
- Lei Wang
- Pingyu Jiang
- Jose L. Martinez Lastra
- Andrew Kusiak
- Weiming Shen
- Fei Tao
- Robert Harrison
- Valeriy Vyatkin
- Francesco Martinelli
- Glen Bright
- Han Zhao
- Alexandre Dolgui
- John W. Fowler
- Michael Weyrich
- Alois Zoitl
- Thorsten Wuest
- Panagiotis D. Christofides
- Kira Barton
- Naiqi Wu
Venues
- CoRR
- WSC
- Int. J. Comput. Integr. Manuf.
- J. Intell. Manuf.
- Comput. Ind. Eng.
- Int. J. Prod. Res.
- Comput. Chem. Eng.
- Sensors
- ICRA
- IEEE Access
- ETFA
- CASE
- Eur. J. Oper. Res.
- ACC
- SMC
- Expert Syst. Appl.
- Comput. Ind.
- CDC
- Int. J. Manuf. Technol. Manag.
- Int. J. Autom. Technol.
- IEEM
- Autom.
- IEEE Trans. Autom. Control.
- Adv. Eng. Informatics
- IGARSS
- APMS (1)
- ECC
- Remote. Sens.
- IEEE Trans Autom. Sci. Eng.
- Comput. Aided Des.
- Oper. Res.
- IEEE Trans. Engineering Management
- Microelectron. Reliab.
- APMS (2)
- Qual. Reliab. Eng. Int.
- ITC
- SOHOMA
- PLM
- Prod. Eng.
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