FAULT LOCALIZATION
Experts
- Franz Wotawa
- Rui Abreu
- W. Eric Wong
- Mark Harman
- Yan Lei
- Árpád Beszédes
- Zhenyu Zhang
- Xiaoguang Mao
- David Lo
- Tsong Yueh Chen
- Steven X. Ding
- W. K. Chan
- Patrick Rodler
- T. H. Tse
- Yong Liu
- Meir Kalech
- Arjan J. C. van Gemund
- Vahid Garousi
- Gordon Fraser
- Kai-Yuan Cai
- Andy Podgurski
- Zheng Li
- Baowen Xu
- Mary Jean Harrold
- Birgit Hofer
- Lu Zhang
- Dan Hao
- Shujuan Jiang
- David W. Binkley
- Xiang Chen
- Vidroha Debroy
- Saeed Parsa
- Irith Pomeranz
- Ossi Taipale
- Josep Silva
- Krishnendu Chakrabarty
- Rolf Drechsler
- Maiying Zhong
- Shin Yoo
Venues
- CoRR
- IEEE Access
- ACC
- ICSE
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Computers
- IEEE Trans. Ind. Electron.
- ICST
- IECON
- J. Syst. Softw.
- IEEE Trans. Software Eng.
- ASE
- Inf. Softw. Technol.
- COMPSAC
- Softw. Test. Verification Reliab.
- ICST Workshops
- CDC
- ITC
- ICSM
- ACM SIGSOFT Softw. Eng. Notes
- QSIC
- ISSTA
- ISSRE
- IEEE Trans. Ind. Informatics
- SEKE
- Eng. Appl. Artif. Intell.
- J. Frankl. Inst.
- Int. J. Syst. Sci.
- ECAI
- SAC
- Autom.
- SMC
- ECC
- QRS Companion
- ESEC/SIGSOFT FSE
- SIGCSE
- J. Electron. Test.
- AAAI
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