FACE DETECTION AND TRACKING
Experts
- Rama Chellappa
- Wen Gao
- Thomas S. Huang
- A. Enis Çetin
- Xiaoou Tang
- Christian Theobalt
- Stan Z. Li
- Shaohua Kevin Zhou
- Eric Granger
- B. Ugur Töreyin
- Vishal M. Patel
- Nassir Navab
- Anil K. Jain
- Nasser Kehtarnavaz
- Tat-Seng Chua
- Dag Johansen
- Pål Halvorsen
- Changsheng Xu
- Christoph Busch
- Brian C. Lovell
- Qingming Huang
- Andrew Zisserman
- Hazem M. El-Bakry
- Hannes Fassold
- Larry S. Davis
- Gerhard Widmer
- Xindi Shang
- Zhen Lei
- Michael Zollhöfer
- Stefano Tubaro
- Håkon Kvale Stensland
- Carsten Griwodz
- Fabrizio Falchi
- Paolo Bestagini
- Modesto Castrillón Santana
- Alois C. Knoll
- Shiguang Shan
- Xilin Chen
- Shuo Yang
Venues
- CoRR
- Sensors
- ICIP
- IEEE Access
- Multim. Tools Appl.
- CVPR
- AVSS
- ICME
- ICASSP
- IEEE Trans. Circuits Syst. Video Technol.
- CVPR Workshops
- J. Real Time Image Process.
- ACM Multimedia
- IROS
- EMBC
- ICPR
- ICCV
- Pattern Recognit. Lett.
- WACV
- SMC
- FG
- Comput. Electron. Agric.
- ICRA
- Remote. Sens.
- EUSIPCO
- Pattern Recognit.
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ITSC
- IEEE Trans. Instrum. Meas.
- ISCAS
- IEEE Trans. Geosci. Remote. Sens.
- VCIP
- BMVC
- IEEE Trans. Intell. Transp. Syst.
- IEEE Trans. Inf. Forensics Secur.
- FUSION
- IJCNN
- ICCV Workshops
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