ELECTRONIC EQUIPMENT
Experts
- Jong-Myon Kim
- Zhongkui Zhu
- Ruqiang Yan
- Xuefeng Chen
- Krishnendu Chakrabarty
- Changqing Shen
- Weihua Li
- Marios M. Polycarpou
- Silvio Simani
- Chuan Li
- Haidong Shao
- Janusz Rajski
- Weiguo Huang
- Xingxing Jiang
- Krishna R. Pattipati
- Fengshou Gu
- Hongxia Pan
- Irith Pomeranz
- Mourad Elhadef
- Pabitra Mohan Khilar
- Khashayar Khorasani
- Sudhakar M. Reddy
- Michael G. Pecht
- Zhibin Zhao
- Orestes Llanes-Santiago
- Vicenç Puig
- Thomas Parisini
- René-Vinicio Sánchez
- Bin Jiang
- Zhaobo Zhang
- Haiyang Pan
- Xinli Gu
- Zhijian Wang
- Yigang He
- Jing Lin
- Andrew D. Ball
- Jinrui Wang
- Ruyi Huang
- Guiji Tang
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- CoRR
- IEEE Trans. Ind. Electron.
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Eng. Appl. Artif. Intell.
- Neurocomputing
- Entropy
- Knowl. Based Syst.
- Reliab. Eng. Syst. Saf.
- ACC
- IECON
- Adv. Eng. Informatics
- J. Intell. Fuzzy Syst.
- Autom.
- CDC
- ECC
- IEEE Trans. Computers
- Neural Comput. Appl.
- Appl. Soft Comput.
- ITC
- I2MTC
- CAA SAFEPROCESS
- ICPHM
- SMC
- Appl. Intell.
- J. Intell. Manuf.
- SAFEPROCESS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Asian Test Symposium
- IJCNN
- CASE
- Comput. Chem. Eng.
- ICAC
- ICNC
- Symmetry
- J. Electron. Test.
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