ELECTRONIC EQUIPMENT
Experts
- Jong-Myon Kim
- Zhongkui Zhu
- Ruqiang Yan
- Xuefeng Chen
- Krishnendu Chakrabarty
- Changqing Shen
- Weihua Li
- Chuan Li
- Silvio Simani
- Marios M. Polycarpou
- Haidong Shao
- Weiguo Huang
- Krishna R. Pattipati
- Janusz Rajski
- Xingxing Jiang
- Fengshou Gu
- Hongxia Pan
- Irith Pomeranz
- Mourad Elhadef
- Sudhakar M. Reddy
- Michael G. Pecht
- Pabitra Mohan Khilar
- Khashayar Khorasani
- Haiyang Pan
- Bin Jiang
- Vicenç Puig
- Zhaobo Zhang
- Xinli Gu
- Zhibin Zhao
- Orestes Llanes-Santiago
- Thomas Parisini
- René-Vinicio Sánchez
- Zhijian Wang
- Yigang He
- Jing Lin
- Jinrui Wang
- Andrew D. Ball
- Lei Shu
- Shunming Li
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- CoRR
- IEEE Trans. Ind. Electron.
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Neurocomputing
- Eng. Appl. Artif. Intell.
- Entropy
- Knowl. Based Syst.
- ACC
- Reliab. Eng. Syst. Saf.
- IECON
- J. Intell. Fuzzy Syst.
- Adv. Eng. Informatics
- Autom.
- CDC
- ECC
- IEEE Trans. Computers
- Neural Comput. Appl.
- Appl. Soft Comput.
- ITC
- I2MTC
- ICPHM
- CAA SAFEPROCESS
- SMC
- Appl. Intell.
- J. Intell. Manuf.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- SAFEPROCESS
- IJCNN
- Asian Test Symposium
- CASE
- Comput. Chem. Eng.
- ICNC
- ICAC
- Symmetry
- J. Electron. Test.
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