DEFECT CLASSIFICATION
Experts
- Rahul Pandita
- Yuji Iwahori
- Yen-Chang Huang
- Bappaditya Dey
- B. V. K. Vijaya Kumar
- Takahiko Horiuchi
- Manas Kamal Bhuyan
- Rosa Rodríguez-Montañés
- Shuhei Watanabe
- Sze-Teng Liong
- Sandip Halder
- Camelia Hora
- Michel Renovell
- Joan Figueras
- Yee Siang Gan
- Yongjune Kim
- Bram Kruseman
- Ram Chillarege
- Md. Tarek Habib
- Gianni D'Angelo
- Salvatore Rampone
- Yongxiong Wang
- Joakim Bruslund Haurum
- Qiwu Luo
- Michael Kaufmann
- Patrizio Angelini
- Vincenzo Roselli
- Stefan Eichenberger
- Chuanfei Hu
- Daniel Arumí
- Hang Shao
- Laurie A. Williams
- Hemerson Pistori
- Thomas B. Moeslund
- Michael A. Bekos
- Xiang Wang
- Clémentine Nebut
- Xiaoxin Fang
- Sang Hwa Lee
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- ITC
- IEEE Access
- Microelectron. Reliab.
- IJCNN
- VTS
- J. Electron. Test.
- IRPS
- Expert Syst. Appl.
- ATS
- J. Intell. Manuf.
- Appl. Soft Comput.
- Commun. Nonlinear Sci. Numer. Simul.
- Multim. Tools Appl.
- ESEM
- Pattern Recognit.
- DATE
- Empir. Softw. Eng.
- Comput. Ind. Eng.
- ICPR
- Mach. Vis. Appl.
- IEEE Des. Test Comput.
- VLSI Design
- IEEE Trans. Very Large Scale Integr. Syst.
- Asian Test Symposium
- IEEE Trans. Ind. Electron.
- ETS
- ICSE (Companion Volume)
- ICASSP
- ICSE
- LATS
- Quantum Inf. Process.
- IEEE Trans. Ind. Informatics
- Int. J. Pattern Recognit. Artif. Intell.
- CompSysTech
- Eng. Appl. Artif. Intell.
- FPGA
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