LATS

Publications

2024

Leonardo R. Gobatto, Fabio Benevenuti, Nemitala Added, Saulo G. Alberton, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Nilberto H. Medina, Fernanda Lima Kastensmidt, José Rodrigo Azambuja
Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. LATS (2024)
Ievgen Kabin, Peter Langendoerfer, Zoya Dyka
Exploiting Static Power Consumption in Side-Channel Analysis. LATS (2024)
Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale
Exploring trade-offs in multi-site wafer testing. LATS (2024)
Rizwan Tariq Syed, Fabian Vargas, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic
Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor. LATS (2024)
Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen
Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation. LATS (2024)
María-Luisa Pinto-Salamanca, Josie E. Rodriguez Condia, José A. Hidalgo-López, Wilson-Javier Pérez-Holguín
Analyzing the Reliability of Stream Sparse Matrix-Vector Multiplication Accelerators: A High-Level Approach. LATS (2024)
Alberto Bosio, M. Gomes, Fabio Pavanello, A. Porsia, Annachiara Ruospo, Ernesto Sánchez, Elena I. Vatajelu
Resiliency Approaches in Convolutional, Photonic, and Spiking Neural Networks. LATS (2024)
Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
DeepER-HD: An Error Resilient HyperDimensional Computing Framework with DNN Front-End for Feature Selection. LATS (2024)
L. Pfeifer, M. Gross, Felix Staudigl, Rainer Leupers, Jan Moritz Joseph
Analysis of Thermal Side-Channel Attacks on Analog/Digital Computing-in-Memory Accelerators. LATS (2024)
Régis Leveugle, Nathan Hocquette, Charles Labarre, Romain Plumaugat, Loic Tcharoukian, Valentin Martinoli, Yannick Teglia
Secured Bus as a Countermeasure against Covert Channels: NEORV32 Case Study. LATS (2024)
Roua Boulifa, Giorgio Di Natale, Paolo Maistri
Internal State Monitoring in RISC-V Microarchitectures for Security Purpose. LATS (2024)
Acácio Cezar Aguiar Costa, Jarbas Aryel Nunes Da Silveira
Case Study: Automated UPS Testing System for Final Test Applications in Industrial Environments. LATS (2024)
Maksim Jenihhin, Mahdi Taheri, Natalia Cherezova, Mohammad Hasan Ahmadilivani, Hardi Selg, Artur Jutman, Konstantin Shibin, Anton Tsertov, Sergei Devadze, Rama Mounika Kodamanchili, Ahsan Rafiq, Jaan Raik, Masoud Daneshtalab
Keynote: Cost-Efficient Reliability for Edge-AI Chips. LATS (2024)
Marko S. Andjelkovic, Milos Krstic
Simulation-Based Analysis and Modeling of Generated Single Event Transient Pulse Width. LATS (2024)
Luis Ariel Mesa, Juan-David Guerrero-Balaguera, Erika D. Castañeda, Ernesto Sánchez, Wilson-Javier Pérez-Holguín
An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs. LATS (2024)
K. Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs
Digital generation of single tone FM/PM test stimuli: a theoretical analysis. LATS (2024)
Sami El Amraoui, Aghiles Douadi, Régis Leveugle, Paolo Maistri
Harmonic Response of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection. LATS (2024)
Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen
Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits. LATS (2024)
Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS (2024)
Rebecca Pelke, Felix Staudigl, Niklas Thomas, Nils Bosbach, Mohammed Hossein, José Cubero-Cascante, Letícia Maria Veiras Bolzani, Rainer Leupers, Jan Moritz Joseph
A Fully Automated Platform for Evaluating ReRAM Crossbars. LATS (2024)
Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. LATS (2024)
Fabian Vargas, Milos Krstic, Marko S. Andjelkovic, Markus Ulbricht, Junchao Chen
Silicon Lifecycle Management Based on On-Chip Cross-Layer Sensing and Analytics for Space Applications. LATS (2024)
25th IEEE Latin American Test Symposium, LATS 2024, Maceio, Brazil, April 9-12, 2024 LATS (2024)
Erik Larsson
Embedded Tutorial: Access to On-chip Instruments via Functional Ports. LATS (2024)
Samuele Germiniani, Daniele Nicoletti, Graziano Pravadelli
Invited Talk: Pros and Cons of Assertion Mining. LATS (2024)
Stefano Aldegheri, Michele Boldo, Chiara Bozzini, Mirco De Marchi, Roberto Di Marco, Enrico Martini, Nicola Bombieri
A Verification Platform for Human Pose Estimation Models. LATS (2024)
Levent Aksoy, Muhammad Yasin, Samuel Pagliarini
CAC 2.0: A Corrupt and Correct Logic Locking Technique Resilient to Structural Analysis Attacks. LATS (2024)
Leonardo Miceli, Elena Ioana Vatajelu, Víctor H. Champac
Fault Analysis for a MTJ-based Spiking Neural Network. LATS (2024)
Junchao Chen, Li Lu, Marko S. Andjelkovic, Fabian Luis Vargas, Milos Krstic
Space Radiation Flux Driven Fault Injection for Evaluating Dynamic Mitigation Strategies. LATS (2024)
Giuseppe Esposito, Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Marco Levorato, Matteo Sonza Reorda
Assessing the Reliability of Different Split Computing Neural Network Applications. LATS (2024)
Sophie Dupuis, Nassim Riadi, Clémy Moroukian, Florence Azaïs, Marie-Lise Flottes
Logic Locking: Exploration of a new key-gate based on tristate logic. LATS (2024)
Jianan Wen, Fabian Luis Vargas, Fukun Zhu, Daniel Reiser, Andrea Baroni, Markus Fritscher, Eduardo Pérez, Marc Reichenbach, Christian Wenger, Milos Krstic
Cycle-Accurate FPGA Emulation of RRAM Crossbar Array: Efficient Device and Variability Modeling with Energy Consumption Assessment. LATS (2024)
Lucas Deutschmann, Yazan Kazhalawi, Jonathan Seckinger, Anna Lena Duque Antón, Johannes Müller, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz
Data-Oblivious and Performant: On Designing Security-Conscious Hardware. LATS (2024)
Victor O. Costa, Fabio Benevenuti, Renan Menezes, Lidia Shibuya Sato, Luis Loures, Fernanda Lima Kastensmidt, Nemitala Added, Saulo G. Alberton, Vitor A. P. Aguiar, Nilberto H. Medina
Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. LATS (2024)
Enrico Magliano, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo
A Micro Architectural Events Aware Real-Time Embedded System Fault Injector. LATS (2024)
Salah Daddinounou, Elena Ioana Vatajelu
Study of a Spintronic-based STDP-trained SNN under Fabrication-induced Process Variability. LATS (2024)
Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich
Vmin Testing under Variations: Defect vs. Fault Coverage. LATS (2024)
Nicola Dall'Ora, Enrico Fraccaroli, Renaud Gillon, Franco Fummi
Analog Fault Simulation: Trends and Perspectives in Analog Hardware Description Languages. LATS (2024)

2023