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- Jong-Myon Kim
- Steven X. Ding
- Xuefeng Chen
- Fengshou Gu
- Andrew D. Ball
- Krishnendu Chakrabarty
- Zhongkui Zhu
- Sudhakar M. Reddy
- Ruqiang Yan
- Marios M. Polycarpou
- Enrico Zio
- Irith Pomeranz
- Chuan Li
- Bin Jiang
- Haidong Shao
- Changqing Shen
- Silvio Simani
- Hiroshi Takahashi
- Khashayar Khorasani
- Zahoor Ahmad
- Shen Yin
- Thomas Parisini
- René-Vinicio Sánchez
- Jianbo Yu
- Weihua Li
- Yigang He
- V. Sugumaran
- Yongbo Li
- Donghua Zhou
- Haiyang Pan
- Xingxing Jiang
- Yang Liu
- Yu Zhang
- Michael G. Pecht
- Janusz Rajski
- Nader Meskin
- Weiguo Huang
- Guang-Hong Yang
- Pabitra Mohan Khilar
Venues
- Sensors
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Trans. Ind. Electron.
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Ind. Informatics
- Expert Syst. Appl.
- IECON
- ACC
- Eng. Appl. Artif. Intell.
- Entropy
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- IEEE Trans. Computers
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- Autom.
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- ITC
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- J. Frankl. Inst.
- IEEE Trans. Reliab.
- IAS
- Neural Comput. Appl.
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- CAA SAFEPROCESS
- IEEE SENSORS
- INDIN
- ICRA
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