CENTRAL CATADIOPTRIC
Experts
- Helder Araújo
- João Pedro Barreto
- Hongbin Zha
- Xianghua Ying
- Pascal Vasseur
- Cédric Demonceaux
- Yihong Wu
- Huixian Duan
- Yue Zhao
- Nuno Gonçalves
- El Mustapha Mouaddib
- Fuqing Duan
- Louis Hodes
- Addi Djikic
- David Fofi
- David Klee
- Iuri Frosio
- Alberto Alzati
- Navid Mahabadi
- Talha Hanif Butt
- Konstantinos Daniilidis
- Antonio Capobianco
- Cristina Turrini
- Ondrej Biza
- Narendra Ahuja
- Fuchao Wu
- Sabah Boustila
- Murtaza Taj
- Maurice F. Fallon
- Robert Platt
- Stergios I. Roumeliotis
- Cesar Nassir
- Christopher Geyer
- Shih-Schön Lin
- James Patrick Underwood
- Philippe Marthon
- Xiaoming Deng
- Robin Walters
- Éric Marchand
Venues
- Sensors
- IROS
- CoRR
- IEEE Trans. Instrum. Meas.
- ICRA
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- CVPR Workshops
- CVPR
- ICCV
- Comput. Vis. Image Underst.
- Image Vis. Comput.
- ICIP
- Int. J. Comput. Vis.
- ICPR
- Pattern Recognit. Lett.
- Inf. Sci.
- CISP-BMEI
- ICPR (4)
- Mach. Vis. Appl.
- CASE
- ICPR (3)
- IEEE Access
- ISER
- WAFR
- Presence Teleoperators Virtual Environ.
- J. Inf. Sci. Eng.
- APSIPA
- SIGGRAPH Posters
- IEEE Trans. Syst. Man Cybern. Syst.
- SIAM J. Control. Optim.
- SMC
- Vis. Comput.
- Multim. Tools Appl.
- J. ACM
- VR/AR
- IEEE Trans. Intell. Transp. Syst.
- Eur. J. Comb.
- Ind. Robot
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