AUTOMATIC INSPECTION
Experts
- Masatoshi Ishikawa
- Akio Namiki
- Yuji Yamakawa
- Emanuele Menegatti
- Idaku Ishii
- Shigang Yue
- Wendy Flores-Fuentes
- Oleg Sergiyenko
- Karsten Berns
- Lars Lindner
- Zhigang Zhu
- Stephen Pollard
- Kolja Kühnlenz
- Yoichiro Maeda
- Jizhong Xiao
- Luciane B. Soares
- Lawrence G. Votta
- Roland Siegwart
- Julio C. Rodríguez-Quiñonez
- Toshio Fukuda
- Yoshihiro Nakabo
- Takeshi Takaki
- Alex Pentland
- Fumio Miyazaki
- Tetsuya Yagi
- Yoshihiro Fujita
- Guangyou Xu
- Maristella Matera
- Roberto Antonio Vázquez
- Rüdiger Dillmann
- Cheng Hu
- Fumiaki Tomita
- Sergey M. Sokolov
- Nobuyuki Yamashita
- Georg Hartmann
- Hiroshi Ishiguro
- Tatsuo Arai
- Marc D. Winterbottom
- Shin'ichiro Okazaki
Venues
- ICRA
- IROS
- Sensors
- CoRR
- MVA
- IEEE Trans. Instrum. Meas.
- Mach. Vis. Appl.
- RoboCup
- ICVS
- ROBIO
- IEEE Trans. Ind. Electron.
- Ind. Robot
- IJCAI
- ICPR
- IEEE Access
- Image Vis. Comput.
- J. Robotics Mechatronics
- ICARCV
- J. Electronic Imaging
- ISCAS
- Int. J. Pattern Recognit. Artif. Intell.
- Multim. Tools Appl.
- Comput. Electron. Agric.
- WACV
- IEEE Trans. Intell. Transp. Syst.
- J. Intell. Robotic Syst.
- Remote. Sens.
- CVPR Workshops
- Robotics Auton. Syst.
- CASE
- J. Sensors
- Comput. Ind. Eng.
- Reliab. Eng. Syst. Saf.
- CVPR
- Comput. Ind.
- BMVC
- IECON
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend