Neutron Beam Attenuation Through Semiconductor Devices During SEU Testing.

S. A. Wender J. M. O'Donnell L. Zavorka Bharat L. Bhuva

Published in: IRPS (2019)

Keyphrases

semiconductor devices
electron beam
x ray
integrated circuit
real time
test cases
design parameters
spatially varying
database
search algorithm
cross section