A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations.
Makoto YabuuchiKoji NiiYasumasa TsukamotoShigeki OhbayashiSusumu ImaokaHiroshi MakinoYoshinobu YamagamiSatoshi IshikuraToshio TeranoToshiyuki OashiKeiji HashimotoAkio SebeGen OkazakiKatsuji SatomiHironori AkamatsuHirofumi ShinoharaPublished in: ISSCC (2007)