A novel deep metric learning model for imbalanced fault diagnosis and toward open-set classification.
Cunjun WangCun XinZili XuPublished in: Knowl. Based Syst. (2021)
Keyphrases
- fault diagnosis
- metric learning
- pattern recognition
- fuzzy logic
- artificial intelligence
- feature extraction
- bp neural network
- support vector
- expert systems
- fault detection
- neural network
- support vector machine svm
- image classification
- multiple faults
- chemical process
- kernel methods
- unsupervised learning
- prior knowledge
- knowledge base
- machine learning