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Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual-material gate-oxide-stack double-gate TFET.
Satyendra Kumar
Published in:
IET Circuits Devices Syst. (2021)
Keyphrases
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field effect transistors
silicon dioxide
leakage current
nano scale
room temperature
supply chain
high density
high temperature
steady state
data sets
multiscale
control system
mathematical analysis
radio frequency
multiple input