A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations.
Koji NiiMakoto YabuuchiYasumasa TsukamotoShigeki OhbayashiSusumu ImaokaHiroshi MakinoYoshinobu YamagamiSatoshi IshikuraToshio TeranoToshiyuki OashiKeiji HashimotoAkio SebeGen OkazakiKatsuji SatomiHironori AkamatsuHirofumi ShinoharaPublished in: IEEE J. Solid State Circuits (2008)