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Off-state stress degradation mechanism on advanced p-MOSFETs.

Moonju ChoAlessio SpessotBen KaczerMarc AoulaicheRomain RitzenthalerTom SchramPierre FazanNaoto HoriguchiDimitri Linten
Published in: ICICDT (2015)
Keyphrases
  • state space
  • computational model
  • learning algorithm
  • social networks
  • probabilistic model
  • low cost
  • information processing