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Modern IC packaging trends and their reliability implications.
R. Plieninger
M. Dittes
Klaus Pressel
Published in:
Microelectron. Reliab. (2006)
Keyphrases
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high speed
integrated circuit
image processing
high density
information technology
reliability analysis
trend detection
real world
information systems
e learning
preprocessing
relational databases
design process
highly reliable
software reliability
emerging trends