TREND DETECTION
Experts
- Andreas Hotho
- Gerd Stumme
- Tzu-Fu Chiu
- Marti A. Hearst
- Greg Goth
- Yu-Ting Chiu
- Chao-Fu Hong
- Elke A. Rundensteiner
- Bernardo A. Huberman
- Jeffrey C. Carver
- Muhammad Amir Mehmood
- Maria R. Lee
- Benoit Aubert
- Albert Reuther
- Soufia Kausar
- Sudeep Pasricha
- Lucila Ohno-Machado
- Fayçal Djeffal
- Hsinchun Chen
- Jiebo Luo
- Hajime Sasaki
- Tim Menzies
- Mor Naaman
- Jeremy Kepner
- Siddharth Samsi
- Casper Lassenius
- Peter Michaleas
- George Mathew
- Tugrulcan Elmas
- Tsung Teng Chen
- Suzanne Rivard
- Ponnurangam Kumaraguru
- Michael Jones
- Nikil D. Dutt
- Volker Roth
- Vijay Gadepally
- Christian Bauckhage
- Christoph Schmitz
- Christian Boß
Venues
- CoRR
- Remote. Sens.
- Scientometrics
- IEEE Access
- IEEE Internet Comput.
- IGARSS
- IEEE Commun. Mag.
- IEEE Softw.
- IEEE Intell. Syst.
- Sensors
- ICWSM
- Commun. ACM
- Prax. Inf.verarb. Kommun.
- AMIA
- IEEE Signal Process. Mag.
- Inf. Process. Manag.
- HICSS
- Neurocomputing
- Computer
- Elektrotech. Informationstechnik
- Proc. IEEE
- Microelectron. Reliab.
- IEEE Micro
- ITQM
- IT Prof.
- ICCCNT
- it Inf. Technol.
- CCE
- SMC
- Artif. Intell. Medicine
- J. Am. Soc. Inf. Sci.
- AMCIS
- ASONAM
- ISMIS
- ACM Comput. Surv.
- First Monday
- Microelectron. J.
- PLoS Comput. Biol.
- IEEE Netw.
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