Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D IC.
Yuling ShangWeipeng TanChunquan LiHaihua FanLizhen ZengPublished in: J. Electron. Test. (2020)
Keyphrases
- fault diagnosis
- integrated circuit
- fault detection
- high density
- multiple faults
- object detection
- detection algorithm
- detection method
- detection rate
- automatic detection
- automatic diagnosis
- high speed
- false positives
- false alarms
- knowledge base
- incipient fault
- detection accuracy
- medical diagnosis
- low cost
- neural network
- model based reasoning
- fault isolation
- wavelet transform
- multi sensor information fusion