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Compact Test Pattern Selection for Small Delay Defect.
Chia-Yuan Chang
Kuan-Yu Liao
Sheng-Chang Hsu
James Chien-Mo Li
Jiann-Chyi Rau
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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pattern matching
small sized
test data
small number
pattern discovery
neural network
clustering algorithm
search algorithm
test cases
selection strategy
pattern detection