Electron Microscopy Experiments Concerning Hysteresis in the Magnetic Lens System.

Patrick J. van Bree C. M. M. van Lierop P. P. J. van den Bosch

Published in: CCA (2010)

Keyphrases

electron microscopy
x ray
low energy
image stacks
magnetic field
thin film
depth from focus
microscopy images
read write
transmission electron microscopy
solid state
building blocks
fully automated
wide angle
random access memory