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Scaling the gate dielectric: Materials, integration, and reliability.

Douglas A. Buchanan
Published in: IBM J. Res. Dev. (1999)
Keyphrases
  • gate dielectrics
  • reliability analysis
  • data integration
  • database
  • learning materials
  • electrical properties
  • silicon dioxide
  • neural network
  • data mining
  • decision trees
  • data model
  • low cost
  • data fusion
  • highly reliable