BIST TPG for Combinational Cluster (Glue Logic) Interconnect Testing at Board Level.

Chen-Huan Chiang Sandeep K. Gupta

Published in: Asian Test Symposium (1998)

Keyphrases

clustering algorithm
asynchronous circuits
high speed
higher level
built in self test
learning algorithm
automated reasoning
database
test set
test cases
data clustering
hierarchical clustering
fault tolerant
software testing
low cost
multi valued
defeasible logic
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