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Automatic Insertion of Scan Structures to Enhance Testability of Embedded Memories, Cores and Chips.
Kamran Zarrineh
Shambhu J. Upadhyaya
Philip Shephard III
Published in:
VTS (1998)
Keyphrases
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high speed
fully automatic
general purpose
low cost
semi automatic
high density
real time
social networks
data driven
embedded systems
integrated circuit
structural analysis
digital signal processors
dynamic random access memory