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FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator.
Yuyang Ye
Zonghui Wang
Zun Xue
Ziqi Wang
Yifei Gao
Hao Yan
Published in:
ACM Great Lakes Symposium on VLSI (2023)
Keyphrases
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pattern generator
fault diagnosis
computer architecture
data driven
fault detection
computer vision
semi automatic
humanoid robot
parallel implementation
image analysis
test data