Login / Signup

FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator.

Yuyang YeZonghui WangZun XueZiqi WangYifei GaoHao Yan
Published in: ACM Great Lakes Symposium on VLSI (2023)
Keyphrases
  • pattern generator
  • fault diagnosis
  • computer architecture
  • data driven
  • fault detection
  • computer vision
  • semi automatic
  • humanoid robot
  • parallel implementation
  • image analysis
  • test data