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Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits.

Yoshinobu HigamiYuzo TakamatsuKewal K. SalujaKozo Kinoshita
Published in: Asian Test Symposium (1999)
Keyphrases
  • correlation analysis
  • fault diagnosis
  • simulation model
  • high speed
  • fault detection
  • simulation models
  • mathematical model
  • machine learning
  • expert systems
  • feature vectors
  • input data
  • circuit design