2×VDD IO buffer with 1×VDD devices considering hot-carrier and gate-oxide reliability issues.

Dharmaray Nedalgi Saroja V. Siddamal S. S. Kerur

Published in: Integr. (2024)

Keyphrases

silicon dioxide
mobile devices
database
reliability analysis
field effect transistors
leakage current
data sets
genetic algorithm
learning algorithm
virtual memory