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On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults.

Li-C. WangMagdy S. AbadirJuhong Zhu
Published in: ITC (2002)
Keyphrases
  • test cases
  • real time
  • neural network
  • data mining
  • high speed
  • training data
  • training set
  • software engineering
  • high efficiency
  • software testing
  • test generation