Detection of CMOS address decoder open faults with March and pseudo random memory tests.
Jan OtterstedtDirk NiggemeyerT. W. WilliamsPublished in: ITC (1998)
Keyphrases
- pseudorandom
- detection method
- error detection
- uniformly distributed
- object detection
- random number
- test cases
- model based diagnosis
- secret key
- fault detection
- low complexity
- false positives
- low power
- neural network
- main memory
- fault diagnosis
- random access
- circuit design
- detection algorithm
- user specific
- high speed
- random numbers
- analog vlsi