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Reliability of 70 nm metamorphic HEMTs.

Maximilian DammannArnulf LeutherRüdiger QuayM. MengHelmer KonstanzerW. JantzMichael Mikulla
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • databases
  • reliability analysis
  • reliability assessment
  • real world
  • genetic algorithm
  • case study
  • highly reliable
  • computer vision
  • database systems
  • image sequences
  • control system
  • software reliability