A Test Pattern Compaction Method Using SAT-Based Fault Grouping.
Yusuke MatsunagaPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2016)
Keyphrases
- test data
- significant improvement
- high accuracy
- detection method
- pairwise
- classification method
- segmentation method
- pattern matching
- support vector machine svm
- fault detection
- fault diagnosis
- synthetic data
- segmentation algorithm
- multiscale
- computational cost
- dynamic programming
- control system
- video sequences
- objective function