Built-in Self-Test for crosstalk faults in a digital VLSI.
Kazuya ShimizuNoriyoshi ItazakiKozo KinoshitaPublished in: Systems and Computers in Japan (2002)
Keyphrases
- built in self test
- integrated circuit
- vlsi circuits
- vlsi design
- fault diagnosis
- signal processing
- high speed
- databases
- pattern recognition
- case study
- computer vision
- digital media
- machine learning
- three dimensional
- image sequences
- low cost
- real time
- information retrieval
- fault detection
- digital video
- correlation analysis
- neural network