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Maximal Defect-Free Component in Nanoscale Crossbar Circuits Amidst Stuck-Open and Stuck-Closed Faults.
Malay Kule
Hafizur Rahaman
Bhargab B. Bhattacharya
Published in:
J. Circuits Syst. Comput. (2019)
Keyphrases
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databases
real time
data sets
data mining
information retrieval
wavelet transform
high speed
fault diagnosis
steady state
scheduling algorithm
software components
fault detection
vlsi circuits
multiple faults
fault models