Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short.
Michel RenovellJean Marc GallièreFlorence AzaïsYves BertrandPublished in: J. Electron. Test. (2003)
Keyphrases
- parameter estimation
- probabilistic model
- em algorithm
- computational model
- sensitivity analysis
- nonlinear dynamics
- cost function
- theoretical analysis
- modeling framework
- neural network
- parameter values
- prediction model
- experimental data
- measured data
- parametric models
- autoregressive
- parameter space
- closed form
- statistical model
- regression model
- prior knowledge
- bayesian networks