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Test Generation Of Analog Switched-Current Circuits.

Cheng-Ping WangChin-Long Wey
Published in: Asian Test Symposium (1996)
Keyphrases
  • test generation
  • circuit design
  • analog vlsi
  • analog circuits
  • design automation
  • test sequences
  • databases
  • quality assurance
  • digital circuits
  • symbolic execution
  • multi agent systems
  • test set