Scan chain encryption for the test, diagnosis and debug of secure circuits.
Mathieu Da SilvaMarie-Lise FlottesGiorgio Di NataleBruno RouzeyrePaolo PrinettoMarco RestifoPublished in: ETS (2017)
Keyphrases
- key management
- encryption scheme
- key exchange
- security properties
- high speed
- digital signature
- fault models
- data confidentiality
- data encryption
- cryptographic protocols
- security analysis
- diagnostic tests
- security mechanisms
- security issues
- built in self test
- delay insensitive
- neural network
- scan data
- secure communication
- standard model
- model based diagnosis
- wireless sensor networks